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MaxMile Photoluminescence Mapping System

MaxMile photoluminescence mapping system is a specially designed PL Mapper which can be used to characterize LED epiwafers for quickly obtaining PL wavelength, intensity, etc.. It has following unique features.

  • Least influence caused by wafer bowing or loading.

  • Descent intensity mapping information.

  • Sampling points or steps can be easily changed/configured by end users.

  • Very durable and affordable in system and service.

 

PL Test Points

Variable mapping points for different application needs


To learn more about MaxMile EpiEL, PL, or EL/PL Combination technologies:

 
   
 
   
 

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