MaxMile Photoluminescence Mapping System
MaxMile photoluminescence mapping system is a specially designed PL Mapper which can be used to characterize LED epiwafers for quickly obtaining PL wavelength, intensity, etc.. It has following unique features.
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Least influence caused by wafer bowing or loading.
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Descent intensity mapping information.
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Sampling points or steps can be easily changed/configured by end users.
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Very durable and affordable in system and service.
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