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Mercury-free Electrical Probes

MaxMile Technologies' MF probes are mercury-free probes which can be widely used for a variety of electrical characterizations of semiconductor samples. MF probes function through instantly forming a well-defined Schottky or MOS device structure in the material. They eliminate time-consuming metallization process. Compared to conventional mercury probes, MF probes do not have cumulative mercury poisonous issue and have the potential to realize more sophisticated measurements.

MF probes enable rapid, economic and nondestructive material characterization. They are ideal tools for both R&D and production applications such as processing monitoring, quality control and rapid feedback.

 


To learn more about MF probes:

(Under Development)

 

   
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EpiEL
PL
EL/PL
MF Probe
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