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1. Sample characterizations service

MaxMile Technologies provides various sample characterization services (currently wafer-scale EL, PL, or EL/PL combination mapping, and CV measurement). Service will be provided free for the first characterization of each technique. Please contact us for further information.

2. Microscope automation service

Optical microscope techniques are usually noncontacting and nondestructive with minimal sample preparation. Optical microscopes are widely used in the semiconductor industry. MaxMile Technologies realizes that these microscopes can be further enhanced/upgraded for more sophisticated applications. MaxMile Technologies offers fully customized automation/ integration services on your existing optical microscopes to empower your specific needs. Please contact us for more details.