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Application Notes

Application notes document MaxMile Technologies' unpublished findings and technical advances or some practical applications of published results. Some employees' previous publications are referred and corresponding references are cited wherever necessary.

۞   MaxMile Robot I System (new)
۞   How to establish the correlation between EpiEL test and device results (new)
۞   Characterizations provided by MaxMile EpiEL systems (updated)
۞   Brief technical specification (PDF) (updated)
۞   An example of auto-generated HTML report (updated)
۞   EpiEL Probes (PDF) (updated)
۞   EpiEL Brochure (PDF) (updated)
۞   Micropipe formation and its driving force issues in SiC growth (PDF)
۞   A method to determine the Burgers vector value of superscrew dislocations in SiC at the wafer level (PDF)
۞   Typical Emissive and electrical characterizations provided by MaxMile's EL mapping systems (PDF)
۞   EL vs. PL (PDF)
۞   Schottky barrier inhomogeneities in SiC Schottky contacts (PDF)

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  SiC epitaxial surface defect characterization (PDF)

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  A structural characterization method using polarized light microscopy and its applications (PDF)
     
 

 

 

 
 
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