20060906: MaxMile Technologies introduces two types of
EpiEL probes for epiwafer electroluminescence mapping
MaxMile Technologies, LLC at Lexington has
recently introduced two types of EpiEL probes to meet
application needs. Type I EpiEL probe can be used to reveal the
electroluminescence characteristics of wide driving current density,
while Type II EpiEL probe can be customized to a specific contact
size to closely simulate the real device for each application. Both
types of probes can be used in existing EpiEL probe station without
any change of hardware configuration. With these probes, MaxMile
Epi-wafer Electroluminescence (EpiEL) mapping system will best meet
various application requirements spanning from research and
development to manufacture.
To learn more about this news....
MaxMile EpiEL mapping systems
provide a unique characterization solution for LED/LD industry. They
characterize the electroluminescence (EL) behavior of unprocessed
light emitting materials as a finished device (such as LED)
functions through electroluminescence.
Related news at: