20060215: MaxMile Technologies releases nondestructive EL mapping
systems for unprocessed LED epiwafers
MaxMile Technologies, LLC at Lexington has released a series of
electroluminescence (EL) mapping systems for LED industry. These
systems can be used to characterize the EL behavior of unprocessed light
emitting wafers as a finished LED functions through
electroluminescence. They are nondestructive in nature and can be
used for wafer-level and micrometric-scale investigations. The
systems may also be used to evaluate the photoluminescence (PL) and
electrical properties of different regions in the light-emitting
materials.
MaxMile Technologies' EL mapping systems not only
enable fast response for material development, but also its
nondestructive nature will dramatically reduce the cost of quality
control and improve cost-effectiveness. These EL systems will help the industry to
accelerate the LED development and to overcome the hurdle to
widespread market penetration.
The EL systems can
be widely used for:
-
fast response for light-emitting
material development including recipe modification, growth and
system optimization,
-
high-volume characterization
ranging from wafer evaluation/screening to device sorting
-
LED research and development with
the combined capability of EL and PL.
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